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Wafer-Zone-Based Vmin Prediction for Adaptive Test

2026 ATS Accepted Paper

Li-Yang Wang(王立揚), Ming-Ze Hsu(徐銘澤), Shang-Ting Lin(林尚廷), James Chien-Mo Li(李建模), Harry H. Chen, Lin-Chien Chen, Joy Tsai, Ching-Ting Lin

ML-based 3DIC Transient Thermal Predictor for Fast Design Space Exploration

2026 ATS Accepted Paper

Wei-Shen Wang(王濰紳), Bing-Chen Li(李秉宸), Po-Chieh Yen(顏柏傑), Shao-Yu Wu(吳紹宇), Yu-Xiang Lin(林裕翔), James Chien-Mo Li(李建模), Norman Chang, Akhilesh Kuma

VACCINE:Variation-Aware CritiCal fault Injection for robust NEuromorphic chip training

2026 ATS Accepted Paper

Chu-Yun Hsiao(蕭筑云), Cheng-Yun Hsieh(謝承運), Jin-Wei Chen(陳晉緯), James Chien-Mo Li(李建模)

2026 邱子軒 榮獲 量子計算 Qiskit Hackathon Taiwan 2026 企業特別獎

2026 王宜蓁 金巧芸 榮獲 2026全國大學校院積體電路(IC)設計競賽 研究所標準元件數位電路設計組 佳作

Online Testing Error Mitigation for Quantum Computers

2026 TCAD Accepted Paper

Cheng-Yun Hsieh(謝承運), James Chien-Mo Li(李建模)

Debugging and Preventing Abnormally High Vmin during Logic Scan Test Bring-up

2025 ITC Accepted Paper, 114年IEEE Taipei Section碩博士論文獎

Min-Hsin Liu(劉旻鑫), Ding-Wei Cheng(鄭定緯), James Chien-Mo Li(李建模), Chris Nigh, Szu Huat Goh, Mason Chern, Bing-Han

Multi-core Vmin and Worst-core Vmin Prediction using SOMAC

2025 VTS Accepted Paper

Jeng-Yu Liao(廖政毓), Li-Yang Wang(王力揚), James Chien-Mo Li(李建模), Harry H. Chen

ML-based Adaptive Wafer Sort to Preserve Diagnostic Information

2025 VTS Accepted Paper

Yun-Sheng Liu(劉昀昇), Min-Hsin Liu(劉旻鑫), James Chien-Mo Li(李建模)

qFD: Coherent and Depolarizing Fault Diagnosis for Quantum Processors

2024 ITC Accepted Paper

Yen-Wei Li(李彥緯), Cheng-Yun Hsieh(謝承運), Meng-Chen Wu(吳孟宸) and Chien-Mo Li(李建模)

Low-Complexity Algorithmic Test Generation for Neuromorphic Chips

2024 DAC Accepted Paper

Hsu-Yu Huang(黃旭鈺), Chu-Yun Hsiao(蕭筑云), Tsung-Te Liu(劉宗德), James Li(李建模)

Dynamic IR-Drop Prediction of At-Speed Two-Vector Tests Using Machine Learning

2024 VLSI TSA Accepted Paper

Yu-Tsung Wu(吳宥璁), Zhe-Jia Liang(梁哲嘉), Chao-Ho Hsieh(謝兆和), Yun-Feng Yang(楊雲丰), Yung-Jen Lee(李詠珍), James Chien-Mo Li(李建模)

High-Speed, Low-Storage Power and Thermal Predictions for ATPG Test Patterns

2023 ITC Accepted Paper

Z-J. Liang(梁哲嘉), Y-T. Wu(吳宥璁), Y-F. Yang(楊雲丰), J-M. Li(李建模), N. Chang, A. Kumar, Y-S. Li

Diagnosis of Systematic Delay Failures through Subset Relationship Analysis

2023 ITC Accepted Paper

Bing-Han Hsieh(謝秉翰), Yun-Sheng Liu(劉昀昇), James Chien-Mo Li(李建模), Chris Nigh, Mason Chern, Gaurav Bhargava

Improving Volume Diagnosis and Debug with Test Failure Clustering and Reorganization

2021 ITC Honorable Mention Award

Mu-Ting Wu(吳牧庭), Cheng-Sian Kuo(郭承賢), James Chien-Mo Li(李建模), Chris Nigh, Gaurav Bhargava

2020 吳辰鋐 榮獲 110年度TICD碩士論文獎 qATG:量子電路測試產生技術

2020 恭賀 謝承運 申請通過「逕行修讀博士學位學生研究提升計畫」

2018 白家誠 方彥鈞 樊恩宇 林嵩儒 陳勃文 榮獲 趨勢科技第二屆 T-Brain AI 競賽預測 ETF價格競賽 第一名

2017 白家誠 白祐承 黃靖軒 榮獲 2017國際積體電路電腦輔助設計(CAD)軟體製作競賽 定題組 第二名 (Net Open Location Finder with Obstacles)

2016 許芝柔 許安薇 趙祥雅 陳采婕 榮獲 2016國際積體電路電腦輔助設計(CAD)軟體製作競賽 定題組 佳作 (Static Timing Analysis)

2008 廖官榆 劉威孝 劉韋志 榮獲 九十六學年度大學校院積體電路電腦輔助設計(CAD)軟體製作競賽 不定題組 特優 ( Logic chain hospital )

2007 蔡維霖 許肇軒 莊惟舜 榮獲 九十五學年度大學校院積體電路電腦輔助設計(CAD)軟體製作競賽 不定題組 優等 ( Multiple Scan Chain Timing Fault Diagnosis Tool )

2006 林修霆 吳濟安 榮獲 九十四學年度大學校院積體電路電腦輔助設計軟體製作競賽 定題組 特優 ( Reducing Scan Testing Power using X-filling )