FAN ATPG
FAN (fan-out-oriented) Automatic Test Pattern Generation and fault simulation command line tool.
View on GitHubGet the code
git clone https://github.com/NTU-LaDS-II/FAN_ATPG.gitReferences
- H. Fujiwara and T. Shimono, "On the Acceleration of Test Generation Algorithms," IEEE Transactions on Computers, vol. C-32, no. 12, pp. 1137–1144, Dec. 1983.
- F. Brglez, D. Bryan, and K. Kozminski, "Combinational Profiles of Sequential Benchmark Circuits," 1989 IEEE International Symposium on Circuits and Systems (ISCAS), 1989.
techlib/mod_nangate45.mdt and techlib/NangateOpenCellLibrary.v are under TECHLIB_LICENSE.

