| Neuromorphic chip testing | MOST | 2021-2023 |
| Neuromorphic chip testing | NSTC | 2023-2026 |
| Probabilistic Circuit Quantum Circuit Testing and Diagnosis | MOST | 2017-2021 |
| Asynchronous Circuit Testing, BIST and DFT, SNN fault model | TSMC MOST | 2015-2020 |
| Machine Learning Testing of System Chip | MOST | 2016-2018 |
| Advanced EDA for Nanometer Technologies | NSC | 2010-2013 |
| Low IR Drop Simulation and Testing | GlobalUnichip | 2011-2017 |
| GPU-based ATPG | TSMC | 2015-2017 |
| Systematic Defect Diagnosis for Yield Improvement | Realtek | 2011-2012 |
| 3D IC Design and Test | NSC | 2011-2014 |
| Robust ATPG for Hold-time Faults | TSMC | 2015-2016 |
| TFT Circuit Design for Flexible Electronics | ITRI | 2006-2012 |
| Small Delay Detect Diagnosis | TSMC | 2009 |
| Advanced Test Compression and ATPG | Syntest | 2008 |
| TFT LCD Driver Design for Testability | Himax | 2005-2007 |
| BIST Diagnosis | NSC | 2005 |
| Scan Chain Fault diagnosis | NSC | 2004 |
| TV Tuner Testing | NSC + Quantek | 2004 |
| IP Design/Test/Verification EDA Tools Integration | MoE | 2004 |
| Low Power Self Testable SOC for 5GHz Wireless Communications | NSoC | 2003 |
